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IPC TM-650 2.4.24C

Glass Transition Temperature and Z-Axis Thermal Expansion by TMA

Organization:
IPC - Association Connecting Electronics Industries
Year: 1994

Abstract: This test is designed to determine the Glass Transition Temperature (Tg) and the Thermal Expansion in the Z-Axis of dielectric materials used in printed boards by the use of thermal mechanical analysis (TMA).
Thermal Expansion (TE) is expressed in Coefficient of Thermal Expansion (CTE) or Percent of Thermal Expansion (PTE).
URI: http://mapnamagz.yabesh.ir/std;query=autho1826AF6708/handle/yse/44338
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    IPC TM-650 2.4.24C

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contributor authorIPC - Association Connecting Electronics Industries
date accessioned2017-09-04T15:42:00Z
date available2017-09-04T15:42:00Z
date copyright34669
date issued1994
identifier otherPIKYCAAAAAAAAAAA.pdf
identifier urihttp://mapnamagz.yabesh.ir/std;query=autho1826AF6708/handle/yse/44338
description abstractThis test is designed to determine the Glass Transition Temperature (Tg) and the Thermal Expansion in the Z-Axis of dielectric materials used in printed boards by the use of thermal mechanical analysis (TMA).
Thermal Expansion (TE) is expressed in Coefficient of Thermal Expansion (CTE) or Percent of Thermal Expansion (PTE).
languageEnglish
titleIPC TM-650 2.4.24Cnum
titleGlass Transition Temperature and Z-Axis Thermal Expansion by TMAen
typestandard
page3
statusActive
treeIPC - Association Connecting Electronics Industries:;1994
contenttypefulltext
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