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Moisture Resistance of High Density Interconnection (HDI) Materials Under High Temperature and Pressure (Pressure Vessel)

contributor authorIPC - Association Connecting Electronics Industries
date accessioned2017-09-04T15:27:56Z
date available2017-09-04T15:27:56Z
date copyright08/01/1998
date issued1998
identifier otherNSWXHAAAAAAAAAAA.pdf
identifier urihttp://mapnamagz.yabesh.ir/std;query=autho1826AF6708/handle/yse/28928
description abstractThis test method is designed to determine the capability of HDI materials and other dielectrics to withstand moisture induced stress as applied by extended time in a pressure vessel. For laminated constructions, the results may be affected by the process conditions.
languageEnglish
titleIPC TM-650 2.6.16.1num
titleMoisture Resistance of High Density Interconnection (HDI) Materials Under High Temperature and Pressure (Pressure Vessel)en
typestandard
page2
statusActive
treeIPC - Association Connecting Electronics Industries:;1998
contenttypefulltext


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