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Semiconductor Device, Field Effect Radiation Hardened (Total Dose and Single Event Effects) Transistor, N-Channel Silicon, Types 2N7509, 2N7510, and 2N7511, JANTXVD, R and JANSD, R

contributor authorDLA - CC - DLA Land and Maritime
date accessioned2017-09-04T18:35:36Z
date available2017-09-04T18:35:36Z
date copyright08/13/2013
date issued2013
identifier otherJJFZFFAAAAAAAAAA.pdf
identifier urihttp://mapnamagz.yabesh.ir/std;query=autho1826AF67FCdardstandardsfen/handle/yse/217653
languageEnglish
titleMIL-PRF-19500/687B VALID NOTICE 1num
titleSemiconductor Device, Field Effect Radiation Hardened (Total Dose and Single Event Effects) Transistor, N-Channel Silicon, Types 2N7509, 2N7510, and 2N7511, JANTXVD, R and JANSD, Ren
typestandard
page1
statusActive
treeDLA - CC - DLA Land and Maritime:;2013
contenttypefulltext


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