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GUIDELINES FOR DEVELOPING RADIATION HARDNESS ASSURANCE DEVICE SPECIFICATIONS

contributor authorDLA - CC - DLA Land and Maritime
date accessioned2017-09-04T18:34:17Z
date available2017-09-04T18:34:17Z
date copyright04/11/2007
date issued2007
identifier otherJGHBACAAAAAAAAAA.pdf
identifier urihttp://mapnamagz.yabesh.ir/std;query=autho1826AF67FCdardstandardsfen/handle/yse/216512
description abstractThe primary objective of this document is to provide guidelines and easy to follow procedures for the preparation of detailed device specifications for the procurement of microcircuits and semiconductor devices where radiation Hardness Assurance (RHA) is required. The guidelines are applicable to MIL-M-38510, MIL-PRF-38534, MIL-PRF-38535, and MIL-PRF-19500 microcircuit and semiconductor device detailed specifications, Standard Microcircuit Drawings (SMDs) as well as other contractor prepared specifications such as Source Control Drawings (SOCD), Selected Item Drawings (SID), and Specification Control Drawings (SCD). Recommended procedures are provided for characterizing the radiation response of a part and for obtaining post-irradiation post-irradiation end-point limits for qualification and Lot Acceptance Tests (LAT).
languageEnglish
titleMIL-HDBK-816 VALID NOTICE 1num
titleGUIDELINES FOR DEVELOPING RADIATION HARDNESS ASSURANCE DEVICE SPECIFICATIONSen
typestandard
page1
statusActive
treeDLA - CC - DLA Land and Maritime:;2007
contenttypefulltext


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