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Surface Roughness and Profile of Metallic Foils (Contacting Stylus Technique)

contributor authorIPC - Association Connecting Electronics Industries
date accessioned2017-09-04T16:19:05Z
date available2017-09-04T16:19:05Z
date copyright02/01/2001
date issued2001
identifier otherTHBGQAAAAAAAAAAA.pdf
identifier urihttp://mapnamagz.yabesh.ir/std;query=autho1826AF6708/handle/yse/82477
description abstractThis method defines the procedure for determining the roughness or profile of metallic foils. The surface finish or roughness of foils shall be evaluated using Ra. Ra is defined as the arithmetic average value of all absolute distances of the roughness profile from the center line within the measuring length. The foil profile of foils shall be evaluated using the parameter RZ (DIN) or RTM, which is defined as the average maximum peak to valley height of five consecutive sampling lengths within the measurement length. This value is approximately equivalent to the values of profile determined from microsectioning techniques. RZ (ISO) is a different parameter from RZ (DIN) and is not applicable to this method.
languageEnglish
titleIPC TM-650 2.2.17Anum
titleSurface Roughness and Profile of Metallic Foils (Contacting Stylus Technique)en
typestandard
page2
statusActive
treeIPC - Association Connecting Electronics Industries:;2001
contenttypefulltext


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