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Test to Determine Sensitivity of Electronic Assemblies to Ultrasonic Energy

contributor authorIPC - Association Connecting Electronics Industries
date accessioned2017-09-04T16:09:40Z
date available2017-09-04T16:09:40Z
date copyright01/01/1995
date issued1995
identifier otherSHKRCAAAAAAAAAAA.pdf
identifier urihttp://mapnamagz.yabesh.ir/std;query=autho1826AF6708/handle/yse/72923
description abstractThe purpose of this test method is to provide a consistent procedure to test the sensitivity of electronic components to ultrasonic energy. There has been a reluctance in the electronics industry to use ultrasonic energy for printed board assemblies cleaning because of the possibility of damage to wire bonds in active, hermetically sealed components or other damage that might cause latent failures. Recent work has shown that electronic components have a low potential for damage from ultrasonics (See 6.1) under conditions seen in most cleaning processes. In addition, MILSTD- 2000 Rev. A and J-STD 001 now allow for the use of ultrasonic cleaning, as does the proposal for IEC TC91 International Standards based on an updated revision of the J-STD-001.
languageEnglish
titleIPC TM-650 2.6.9.1num
titleTest to Determine Sensitivity of Electronic Assemblies to Ultrasonic Energyen
typestandard
page5
statusActive
treeIPC - Association Connecting Electronics Industries:;1995
contenttypefulltext


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