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Measuring Hole Pattern Location

contributor authorIPC - Association Connecting Electronics Industries
date accessioned2017-09-04T15:40:50Z
date available2017-09-04T15:40:50Z
date copyright32112
date issued1987
identifier otherBAIKCAAAAAAAAAAA.pdf
identifier urihttp://mapnamagz.yabesh.ir/std;query=autho1826AF6708/handle/yse/43079
description abstractThis is a non-destructive test method for quickly and accurately measuring hole pattern locations.
languageEnglish
titleIPC TM-650 2.2.19num
titleMeasuring Hole Pattern Locationen
typestandard
page1
statusActive
treeIPC - Association Connecting Electronics Industries:;1987
contenttypefulltext


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